Estudo dos efeitos combinados da interferência eletromagnética e envelhecimento na confiabilidade do microcontrolador Cortex-M4

• Ano de defesa: 2021
• Autor(a) principal: Soares, Matheus Fay
• Orientador(a): Benfica, Juliano D'Ornelas
• Tipo de documento: Dissertação
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Pontifícia Universidade Católica do Rio Grande do Sul
• Programa de Pós-Graduação: Programa de Pós-Graduação em Engenharia Elétrica
• Departamento: Escola Politécnica
• País: Brasil
• Palavras-chave em Português: EMI Conduzida; Envelhecimento Acelerado; Processador Cortex-M4; Análise de Confiabilidade
• Palavras-chave em Inglês: Conducted EMI; Accelerated Aging; Cortex-M4 Processor; Reliability Analysis
• Área do conhecimento CNPq: ENGENHARIAS
• Link de acesso: http://tede2.pucrs.br/tede2/handle/tede/9658

Technology has evolved significantly over time, bringing considerable changes to society. As technology advances, microcontrollers, important electronic components of systems, are increasingly used in critical applications while the operating environment becomes increasingly unfavorable, with greater interferences detrimental to proper functioning. In this context, electromagnetic interference (EMI), represents one of the most critical problems when we approach the reliability and robustness of electronic systems and, it worsens when associated with the natural effect of aging, making these parameters essential for the development and reliability of integrated circuits. This work details the development of a testing methodology that makes it possible to evaluate the behavior of microcontrollers as a function of aging and the EMI conducted at the power terminals. The analysis of the behavior and variations of the characteristics was carried out through the tests described in the IEC 61000-4-4 and IEC 61000-4-6 standards in a Cortex-M4 microcontroller, using three different accelerated aging methods: high temperatures, thermal cycles, and overvoltage in the supply. The results obtained have showed a significant variation in the reliability of the microcontroller sample and its operating parameters after different levels of aging. Thus, the methodology developed allows developers of systems and integrated circuits an effective method to assess susceptibility to conducted EMI, enabling the development of techniques to increase the reliability and robustness of projects.