Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
Main Author: | |
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Publication Date: | 2005 |
Other Authors: | , , , |
Format: | Article |
Language: | eng |
Source: | Repositório Institucional da UNESP |
Download full: | http://dx.doi.org/10.1063/1.2133902 http://hdl.handle.net/11449/38294 |
Summary: | The ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field. |
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Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor methodThe ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field.Paulista State Univ, UNESP, Inst Chem, BR-14801970 Arraraquara, SP, BrazilPaulista State Univ, UNESP, Inst Chem, BR-14801970 Arraraquara, SP, BrazilAmerican Institute of Physics (AIP)Universidade Estadual Paulista (Unesp)Simoes, A. Z.Ramirez, M. A.Riccardi, C. S.Longo, Elson [UNESP]Varela, José Arana [UNESP]2014-05-20T15:28:30Z2014-05-20T15:28:30Z2005-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article5application/pdfhttp://dx.doi.org/10.1063/1.2133902Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005.0021-8979http://hdl.handle.net/11449/3829410.1063/1.2133902WOS:000234119600063WOS000234119600063.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Applied Physics2.1760,739info:eu-repo/semantics/openAccess2025-05-28T08:33:08Zoai:repositorio.unesp.br:11449/38294Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestrepositoriounesp@unesp.bropendoar:29462025-05-28T08:33:08Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
title |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
spellingShingle |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method Simoes, A. Z. |
title_short |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
title_full |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
title_fullStr |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
title_full_unstemmed |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
title_sort |
Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method |
author |
Simoes, A. Z. |
author_facet |
Simoes, A. Z. Ramirez, M. A. Riccardi, C. S. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author_role |
author |
author2 |
Ramirez, M. A. Riccardi, C. S. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author2_role |
author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Simoes, A. Z. Ramirez, M. A. Riccardi, C. S. Longo, Elson [UNESP] Varela, José Arana [UNESP] |
description |
The ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field. |
publishDate |
2005 |
dc.date.none.fl_str_mv |
2005-12-01 2014-05-20T15:28:30Z 2014-05-20T15:28:30Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1063/1.2133902 Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005. 0021-8979 http://hdl.handle.net/11449/38294 10.1063/1.2133902 WOS:000234119600063 WOS000234119600063.pdf |
url |
http://dx.doi.org/10.1063/1.2133902 http://hdl.handle.net/11449/38294 |
identifier_str_mv |
Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005. 0021-8979 10.1063/1.2133902 WOS:000234119600063 WOS000234119600063.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Journal of Applied Physics 2.176 0,739 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
5 application/pdf |
dc.publisher.none.fl_str_mv |
American Institute of Physics (AIP) |
publisher.none.fl_str_mv |
American Institute of Physics (AIP) |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
repositoriounesp@unesp.br |
_version_ |
1834482936741625856 |