Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method

Bibliographic Details
Main Author: Simoes, A. Z.
Publication Date: 2005
Other Authors: Ramirez, M. A., Riccardi, C. S., Longo, Elson [UNESP], Varela, José Arana [UNESP]
Format: Article
Language: eng
Source: Repositório Institucional da UNESP
Download full: http://dx.doi.org/10.1063/1.2133902
http://hdl.handle.net/11449/38294
Summary: The ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field.
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spelling Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor methodThe ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field.Paulista State Univ, UNESP, Inst Chem, BR-14801970 Arraraquara, SP, BrazilPaulista State Univ, UNESP, Inst Chem, BR-14801970 Arraraquara, SP, BrazilAmerican Institute of Physics (AIP)Universidade Estadual Paulista (Unesp)Simoes, A. Z.Ramirez, M. A.Riccardi, C. S.Longo, Elson [UNESP]Varela, José Arana [UNESP]2014-05-20T15:28:30Z2014-05-20T15:28:30Z2005-12-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article5application/pdfhttp://dx.doi.org/10.1063/1.2133902Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005.0021-8979http://hdl.handle.net/11449/3829410.1063/1.2133902WOS:000234119600063WOS000234119600063.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Applied Physics2.1760,739info:eu-repo/semantics/openAccess2025-05-28T08:33:08Zoai:repositorio.unesp.br:11449/38294Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestrepositoriounesp@unesp.bropendoar:29462025-05-28T08:33:08Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
title Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
spellingShingle Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
Simoes, A. Z.
title_short Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
title_full Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
title_fullStr Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
title_full_unstemmed Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
title_sort Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
author Simoes, A. Z.
author_facet Simoes, A. Z.
Ramirez, M. A.
Riccardi, C. S.
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
author_role author
author2 Ramirez, M. A.
Riccardi, C. S.
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Simoes, A. Z.
Ramirez, M. A.
Riccardi, C. S.
Longo, Elson [UNESP]
Varela, José Arana [UNESP]
description The ferroelectric properties and leakage current mechanisms of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on La0.5Sr0.5CoO3 by the polymeric precursor method were investigated. These films showed excellent ferroelectric properties in terms of large remnant polarization (2P(r)) of 47.6 mu C/cm(2) and (2E(c)) of 55 kV/cm, fatigue-free characteristics up to 10(10) switching cycles, and a current density of 0.7 mu A/cm(2) at 10 kV/cm. X-ray diffraction and scanning electron microscope investigations indicate that the deposited films exhibit a dense, well-crystallized microstructure having random orientations and with a rather smooth surface morphology. The improved ferroelectric and leakage current characteristics can be ascribed to the platelike grains of the BLT films, which make the domain walls easier to be switched under external field.
publishDate 2005
dc.date.none.fl_str_mv 2005-12-01
2014-05-20T15:28:30Z
2014-05-20T15:28:30Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1063/1.2133902
Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005.
0021-8979
http://hdl.handle.net/11449/38294
10.1063/1.2133902
WOS:000234119600063
WOS000234119600063.pdf
url http://dx.doi.org/10.1063/1.2133902
http://hdl.handle.net/11449/38294
identifier_str_mv Journal of Applied Physics. Melville: Amer Inst Physics, v. 98, n. 11, 5 p., 2005.
0021-8979
10.1063/1.2133902
WOS:000234119600063
WOS000234119600063.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Journal of Applied Physics
2.176
0,739
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 5
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics (AIP)
publisher.none.fl_str_mv American Institute of Physics (AIP)
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv repositoriounesp@unesp.br
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