Silício poroso para aplicações em sensores e microssistemas.

Detalhes bibliográficos
Ano de defesa: 2000
Autor(a) principal: Galeazzo, Elisabete
Orientador(a): Não Informado pela instituição
Banca de defesa: Não Informado pela instituição
Tipo de documento: Tese
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Biblioteca Digitais de Teses e Dissertações da USP
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Palavras-chave em Português:
Link de acesso: https://www.teses.usp.br/teses/disponiveis/3/3140/tde-06112024-160620/
Resumo: Photoluminescent porous silicon (PS) is a promise material for optoelectronic applications. Due to its high surface area and chemical reactive characteristic can be utilised as sensor material, and, through porous silicon formation on selective areas, as sacrificial material for fabrication of microelectromecanism. This work presents the obtention of PS monolayers and multilayers characterised structurally by gravimetric technique, Raman spectroscopy, scanning electron microscopy andatomic force microscopy. Alterations of surface chemical bonds are analysed by Fourier transform infrared (FTIR) due the ageing process and chemical treatments. The evolution of photoluminescence is correlationed with FTIR measurements with the aim to contribute on clearing up about PS light emission basic mechanism. The alterations of electrical properties of the oxidised PS devices, submitted to saturated environment with polar and apolar molecules are characterised through impedance and capacitance measure. The PS electrical conduction mechanism is related with charge carrier transport through localised states on PS surface. Selective PS formation during anodization was implemented by mean of thick silicon oxide deposition and hydrogen ion implantation processes. The thick silicon oxide deposited by plasma enhanced chemical vapour deposition \"PECVD\" limits the anodization time and induces stress between the interface of oxide and Si. The hydrogen ion implantationassociated with adequate annealing was utilised for the first time with the intuit to block the anodization. PS selective and isotropic layers were obtained with this technique.