Espectroscopia óptica de pontos quânticos de InAs auto-construídos em matriz de GaAs

• Ano de defesa: 2001
• Autor(a) principal: Rogerio Lucio de Almeida
• Tipo de documento: Dissertação
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Universidade Federal de Minas Gerais; UFMG
• Palavras-chave em Português: Espectroscopia óptica; Análise espectral; Física
• Link de acesso: http://hdl.handle.net/1843/BUBD-9HDNLT

In this work we present an optical study of InAs quantum dots multilayers embedded in GaAs. These InAs/GaAs quantum-dots have been grown by molecular beam epitaxy. We analyzed the influence of the InAs coverage on the optical properties of InAs SADs by using Photoluminescence (PL) and Excitation Photoluminescence (PLE) techniques. Measurements of Atomic Force Microscope (AFM) were also carried out on the surfaces of the samples to acquire topological information about the quantum dots.Our results reveal that the sample with the InAs coverage around 2.1 ML of InAs (thickness in which occurs the transition of coherent growth to incoherent) presents a very narrow photoluminescence line from the quantum dots (13,7 meV). This line-width indicates a very narrow size distribution of the dots. The PLE measurements identified different contributions in the spectra coming from quantum dots and wetting layer.