O impacto do efeito de geração nas falsas memórias
Ano de defesa: | 2009 |
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Autor(a) principal: | |
Orientador(a): | |
Banca de defesa: | |
Tipo de documento: | Dissertação |
Tipo de acesso: | Acesso aberto |
Idioma: | por |
Instituição de defesa: |
Pontifícia Universidade Católica do Rio Grande do Sul
Porto Alegre |
Programa de Pós-Graduação: |
Não Informado pela instituição
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Departamento: |
Não Informado pela instituição
|
País: |
Não Informado pela instituição
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Palavras-chave em Português: | |
Link de acesso: | http://hdl.handle.net/10923/4900 |
Resumo: | This work has two sections: a theoretical and an empirical, which deals with the Generation Effect (GE) and False Memories (FM). In the first section, the theoretical one, GE and FM classic studies were presented, as well as some explanatory models of these phenomena. Later, the theoretical basis to support the hypothesis that the GE would not only enhance true memory (TM) but also FM is explored. In the empirical section the purpose was to understand the impact of GE on TM and FM, investigating the possibility that EG could reduce FM. Furthermore, the effect of time of testing on the persistence of both true and false memory was assessed on an immediate and one week delayed recognition test. The certainty degree was also measured. Results showed that the GE (e. g. , increase of TM) is due to a strengthening of literal memory traces, so that FM rising was not observed. Yet, FM, under GE, did not seem to rise with time elapse. However, GE represents a TM benefit when a repetition of the evaluation from the same information is performed. |