Simple method for detection of the self-heating signature

Bibliographic Details
Main Author: Mori, C. A. B.
Publication Date: 2017
Other Authors: Agopian, P. G. D. [UNESP], Martino, J. A., IEEE
Format: Conference object
Language: eng
Source: Repositório Institucional da UNESP
Download full: http://hdl.handle.net/11449/160129
Summary: This paper reports a simple method for detection of the self-heating effect through a special signature, without the need of specific structures or high frequency systems, even in devices presenting positive output conductances. In order to develop this method, simple numerical models were employed, and later verified through experimental observation with pFinFET devices.
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spelling Simple method for detection of the self-heating signatureSelf-heating effectFinFETSemiconductor-On-InsulatorThis paper reports a simple method for detection of the self-heating effect through a special signature, without the need of specific structures or high frequency systems, even in devices presenting positive output conductances. In order to develop this method, simple numerical models were employed, and later verified through experimental observation with pFinFET devices.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Univ Sao Paulo, LSI PSI, Sao Paulo, BrazilSao Paulo State Univ UNESP, Sao Joao Da Boa Vista, BrazilSao Paulo State Univ UNESP, Sao Joao Da Boa Vista, BrazilIeeeUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Mori, C. A. B.Agopian, P. G. D. [UNESP]Martino, J. A.IEEE2018-11-26T15:47:35Z2018-11-26T15:47:35Z2017-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject42017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands. New York: Ieee, 4 p., 2017.http://hdl.handle.net/11449/160129WOS:00042652450000504969095954656960000-0002-0886-7798Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sandsinfo:eu-repo/semantics/openAccess2025-04-03T15:36:26Zoai:repositorio.unesp.br:11449/160129Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestrepositoriounesp@unesp.bropendoar:29462025-04-03T15:36:26Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Simple method for detection of the self-heating signature
title Simple method for detection of the self-heating signature
spellingShingle Simple method for detection of the self-heating signature
Mori, C. A. B.
Self-heating effect
FinFET
Semiconductor-On-Insulator
title_short Simple method for detection of the self-heating signature
title_full Simple method for detection of the self-heating signature
title_fullStr Simple method for detection of the self-heating signature
title_full_unstemmed Simple method for detection of the self-heating signature
title_sort Simple method for detection of the self-heating signature
author Mori, C. A. B.
author_facet Mori, C. A. B.
Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
author_role author
author2 Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Mori, C. A. B.
Agopian, P. G. D. [UNESP]
Martino, J. A.
IEEE
dc.subject.por.fl_str_mv Self-heating effect
FinFET
Semiconductor-On-Insulator
topic Self-heating effect
FinFET
Semiconductor-On-Insulator
description This paper reports a simple method for detection of the self-heating effect through a special signature, without the need of specific structures or high frequency systems, even in devices presenting positive output conductances. In order to develop this method, simple numerical models were employed, and later verified through experimental observation with pFinFET devices.
publishDate 2017
dc.date.none.fl_str_mv 2017-01-01
2018-11-26T15:47:35Z
2018-11-26T15:47:35Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv 2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands. New York: Ieee, 4 p., 2017.
http://hdl.handle.net/11449/160129
WOS:000426524500005
0496909595465696
0000-0002-0886-7798
identifier_str_mv 2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands. New York: Ieee, 4 p., 2017.
WOS:000426524500005
0496909595465696
0000-0002-0886-7798
url http://hdl.handle.net/11449/160129
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 4
dc.publisher.none.fl_str_mv Ieee
publisher.none.fl_str_mv Ieee
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv repositoriounesp@unesp.br
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