Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates
Main Author: | |
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Publication Date: | 2017 |
Other Authors: | , , , , , , , |
Format: | Conference object |
Language: | eng |
Source: | Repositório Institucional da UFMG |
Download full: | https://doi.org/10.17648/bwsp-2017-79325 http://hdl.handle.net/1843/54111 https://orcid.org/0000-0002-5778-7161 https://orcid.org/0000-0003-1081-0915 https://orcid.org/0000-0001-6792-7554 https://orcid.org/0000-0002-4998-4624 https://orcid.org/0000-0002-3285-5447 https://orcid.org/0000-0002-8703-4283 https://orcid.org/0000-0002-8556-386X |
Summary: | The optical response of exfoliated graphene on different surfaces (silicon dioxide (SiO2) and hexagonal boron nitride (hBN)) is investigated via scattering-type scanning near-field optical microscopy (s-SNOM) using broadband infrared synchrotron radiation. Basically, we use a commercial s-SNOM microscope integrated into the infrared synchrotron-based beamline to investigate with nanoscale resolution the optical response of different graphene layers on SiO2 or hBN substrates. Comparing atomic force microscopic topography and broadband mid-infrared images (lateral resolution of 30 nm), we confirm that optical response of both systems depends on the specific interactions between graphene and substrate as well as on the number of graphene layers. This dependence is explained by particular interactions of graphene and SiO2, wherein graphene plasmons couple to surface phonon-polaritons of SiO2. In the case of graphene and hBN, we observe coupling of the graphene plasmon to the hyperbolic phonon-polaritons of hBN. |
id |
UFMG_9a44fe31b491639e662a63251a38af6c |
---|---|
oai_identifier_str |
oai:repositorio.ufmg.br:1843/54111 |
network_acronym_str |
UFMG |
network_name_str |
Repositório Institucional da UFMG |
repository_id_str |
|
spelling |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substratesGraphene plasmonsBoron nitridePhonons polaritonsPlasmonsNitreto de boroFononsPolaritonsGrafenoThe optical response of exfoliated graphene on different surfaces (silicon dioxide (SiO2) and hexagonal boron nitride (hBN)) is investigated via scattering-type scanning near-field optical microscopy (s-SNOM) using broadband infrared synchrotron radiation. Basically, we use a commercial s-SNOM microscope integrated into the infrared synchrotron-based beamline to investigate with nanoscale resolution the optical response of different graphene layers on SiO2 or hBN substrates. Comparing atomic force microscopic topography and broadband mid-infrared images (lateral resolution of 30 nm), we confirm that optical response of both systems depends on the specific interactions between graphene and substrate as well as on the number of graphene layers. This dependence is explained by particular interactions of graphene and SiO2, wherein graphene plasmons couple to surface phonon-polaritons of SiO2. In the case of graphene and hBN, we observe coupling of the graphene plasmon to the hyperbolic phonon-polaritons of hBN.CNPq - Conselho Nacional de Desenvolvimento Científico e TecnológicoFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas GeraisCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível SuperiorINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)Universidade Federal de Minas GeraisBrasilICX - DEPARTAMENTO DE FÍSICAUFMG2023-05-29T19:20:27Z2023-05-29T19:20:27Z2017info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectpdfapplication/pdfhttps://doi.org/10.17648/bwsp-2017-793252527-0672http://hdl.handle.net/1843/54111https://orcid.org/0000-0002-5778-7161https://orcid.org/0000-0003-1081-0915https://orcid.org/0000-0001-6792-7554https://orcid.org/0000-0002-4998-4624https://orcid.org/0000-0002-3285-5447https://orcid.org/0000-0002-8703-4283https://orcid.org/0000-0002-8556-386XengBrazilian Workshop on Semiconductor PhysicsIngrid David BarcelosAlisson Ronieri CadoreLeonardo Cristiano CamposKenji WatanabeTakashi TaniguchiFrancisco Carlos Barbosa MaiaRaul de Oliveira FreitasÂngelo Malachias de SouzaChristoph Friedrich Denekeinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFMGinstname:Universidade Federal de Minas Gerais (UFMG)instacron:UFMG2023-05-29T21:34:58Zoai:repositorio.ufmg.br:1843/54111Repositório InstitucionalPUBhttps://repositorio.ufmg.br/oairepositorio@ufmg.bropendoar:2023-05-29T21:34:58Repositório Institucional da UFMG - Universidade Federal de Minas Gerais (UFMG)false |
dc.title.none.fl_str_mv |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
title |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
spellingShingle |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates Ingrid David Barcelos Graphene plasmons Boron nitride Phonons polaritons Plasmons Nitreto de boro Fonons Polaritons Grafeno |
title_short |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
title_full |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
title_fullStr |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
title_full_unstemmed |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
title_sort |
Infrared nano-imaging and -spectroscopy of N graphene layers on SiO2 and hexagonal boron nitride substrates |
author |
Ingrid David Barcelos |
author_facet |
Ingrid David Barcelos Alisson Ronieri Cadore Leonardo Cristiano Campos Kenji Watanabe Takashi Taniguchi Francisco Carlos Barbosa Maia Raul de Oliveira Freitas Ângelo Malachias de Souza Christoph Friedrich Deneke |
author_role |
author |
author2 |
Alisson Ronieri Cadore Leonardo Cristiano Campos Kenji Watanabe Takashi Taniguchi Francisco Carlos Barbosa Maia Raul de Oliveira Freitas Ângelo Malachias de Souza Christoph Friedrich Deneke |
author2_role |
author author author author author author author author |
dc.contributor.author.fl_str_mv |
Ingrid David Barcelos Alisson Ronieri Cadore Leonardo Cristiano Campos Kenji Watanabe Takashi Taniguchi Francisco Carlos Barbosa Maia Raul de Oliveira Freitas Ângelo Malachias de Souza Christoph Friedrich Deneke |
dc.subject.por.fl_str_mv |
Graphene plasmons Boron nitride Phonons polaritons Plasmons Nitreto de boro Fonons Polaritons Grafeno |
topic |
Graphene plasmons Boron nitride Phonons polaritons Plasmons Nitreto de boro Fonons Polaritons Grafeno |
description |
The optical response of exfoliated graphene on different surfaces (silicon dioxide (SiO2) and hexagonal boron nitride (hBN)) is investigated via scattering-type scanning near-field optical microscopy (s-SNOM) using broadband infrared synchrotron radiation. Basically, we use a commercial s-SNOM microscope integrated into the infrared synchrotron-based beamline to investigate with nanoscale resolution the optical response of different graphene layers on SiO2 or hBN substrates. Comparing atomic force microscopic topography and broadband mid-infrared images (lateral resolution of 30 nm), we confirm that optical response of both systems depends on the specific interactions between graphene and substrate as well as on the number of graphene layers. This dependence is explained by particular interactions of graphene and SiO2, wherein graphene plasmons couple to surface phonon-polaritons of SiO2. In the case of graphene and hBN, we observe coupling of the graphene plasmon to the hyperbolic phonon-polaritons of hBN. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017 2023-05-29T19:20:27Z 2023-05-29T19:20:27Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://doi.org/10.17648/bwsp-2017-79325 2527-0672 http://hdl.handle.net/1843/54111 https://orcid.org/0000-0002-5778-7161 https://orcid.org/0000-0003-1081-0915 https://orcid.org/0000-0001-6792-7554 https://orcid.org/0000-0002-4998-4624 https://orcid.org/0000-0002-3285-5447 https://orcid.org/0000-0002-8703-4283 https://orcid.org/0000-0002-8556-386X |
url |
https://doi.org/10.17648/bwsp-2017-79325 http://hdl.handle.net/1843/54111 https://orcid.org/0000-0002-5778-7161 https://orcid.org/0000-0003-1081-0915 https://orcid.org/0000-0001-6792-7554 https://orcid.org/0000-0002-4998-4624 https://orcid.org/0000-0002-3285-5447 https://orcid.org/0000-0002-8703-4283 https://orcid.org/0000-0002-8556-386X |
identifier_str_mv |
2527-0672 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Brazilian Workshop on Semiconductor Physics |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
pdf application/pdf |
dc.publisher.none.fl_str_mv |
Universidade Federal de Minas Gerais Brasil ICX - DEPARTAMENTO DE FÍSICA UFMG |
publisher.none.fl_str_mv |
Universidade Federal de Minas Gerais Brasil ICX - DEPARTAMENTO DE FÍSICA UFMG |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFMG instname:Universidade Federal de Minas Gerais (UFMG) instacron:UFMG |
instname_str |
Universidade Federal de Minas Gerais (UFMG) |
instacron_str |
UFMG |
institution |
UFMG |
reponame_str |
Repositório Institucional da UFMG |
collection |
Repositório Institucional da UFMG |
repository.name.fl_str_mv |
Repositório Institucional da UFMG - Universidade Federal de Minas Gerais (UFMG) |
repository.mail.fl_str_mv |
repositorio@ufmg.br |
_version_ |
1835272038631079936 |