A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo

Detalhes bibliográficos
Autor(a) principal: Bohatchuk D.A.*
Data de Publicação: 2008
Outros Autores: Kuhnem Jr. P.R.*, Casa, Ricardo Trezzi, Reis E.M., Bogo, Amauri, Moreira E.N.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da Udesc
dARK ID: ark:/33523/001300000b9xh
Texto Completo: https://repositorio.udesc.br/handle/UDESC/10071
Resumo: Wheat leaf diseases cause damage by reducing photosynthetic activity in leaves. The objective was to obtain damage model equations for a wheat multiple pathosystem, by examining the relation between grain yield and the incidence of leaf diseases at different plant growth stages. The experiments were carried in Lages and Sẽo José do Cerrito, SC, during the 2005/06 and 2006/07 crop seasons with cultivars Ônix and BRS Louro. The gradient of disease incidence was obtained by the number of fungicide applications (one, two, and three) and three different fungicide rates: azoxystrobin+cyproconazol (40+16, 60+24 and 80+32 g of a.i. ha-1), trifloxystrobin+tebuconazol (25+50, 50+100 and 75+150 g of a.i. ha-1) and pyraclostrobin+epoxyconazol (33.25+12.5, 66.5+25 e 99.75+37.5 g of a.i. ha-1). Each experiment consisted of ten treatments distributed according to the random block scheme with four repetitions. The leaf disease incidence was evaluated at the growth stages EC 31, 34, 40, 52 and 60 according to Zadok's scale. There was significant correlation between two places and harvests for BRS Louro cultivar in the 40 and 50 plant growth stages. However, this was only significant for the Ônix cultivar in São José do Cerrito in both harvests. The variation between the damage model equations indicates the necessity to continue this research in different places and years, using cultivars with similar leaf disease reactions to those tested in this work. Copyright by the Brazilian Phytopathological Society.
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spelling A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiploWheat leaf diseases cause damage by reducing photosynthetic activity in leaves. The objective was to obtain damage model equations for a wheat multiple pathosystem, by examining the relation between grain yield and the incidence of leaf diseases at different plant growth stages. The experiments were carried in Lages and Sẽo José do Cerrito, SC, during the 2005/06 and 2006/07 crop seasons with cultivars Ônix and BRS Louro. The gradient of disease incidence was obtained by the number of fungicide applications (one, two, and three) and three different fungicide rates: azoxystrobin+cyproconazol (40+16, 60+24 and 80+32 g of a.i. ha-1), trifloxystrobin+tebuconazol (25+50, 50+100 and 75+150 g of a.i. ha-1) and pyraclostrobin+epoxyconazol (33.25+12.5, 66.5+25 e 99.75+37.5 g of a.i. ha-1). Each experiment consisted of ten treatments distributed according to the random block scheme with four repetitions. The leaf disease incidence was evaluated at the growth stages EC 31, 34, 40, 52 and 60 according to Zadok's scale. There was significant correlation between two places and harvests for BRS Louro cultivar in the 40 and 50 plant growth stages. However, this was only significant for the Ônix cultivar in São José do Cerrito in both harvests. The variation between the damage model equations indicates the necessity to continue this research in different places and years, using cultivars with similar leaf disease reactions to those tested in this work. Copyright by the Brazilian Phytopathological Society.2024-12-06T19:23:11Z2008info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlep. 363 - 3691983-205210.1590/S1982-56762008000500004https://repositorio.udesc.br/handle/UDESC/10071ark:/33523/001300000b9xhTropical Plant Pathology335Bohatchuk D.A.*Kuhnem Jr. P.R.*Casa, Ricardo TrezziReis E.M.Bogo, AmauriMoreira E.N.engreponame:Repositório Institucional da Udescinstname:Universidade do Estado de Santa Catarina (UDESC)instacron:UDESCinfo:eu-repo/semantics/openAccess2024-12-07T21:06:54Zoai:repositorio.udesc.br:UDESC/10071Biblioteca Digital de Teses e Dissertaçõeshttps://pergamumweb.udesc.br/biblioteca/index.phpPRIhttps://repositorio-api.udesc.br/server/oai/requestri@udesc.bropendoar:63912024-12-07T21:06:54Repositório Institucional da Udesc - Universidade do Estado de Santa Catarina (UDESC)false
dc.title.none.fl_str_mv A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
title A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
spellingShingle A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
Bohatchuk D.A.*
title_short A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
title_full A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
title_fullStr A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
title_full_unstemmed A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
title_sort A critical-point model to estimate damage caused by wheat leaf diseases in a multiple pathosystem Modelo de ponto crítico para estimar danos de doenças foliares do trigo em patossistema múltiplo
author Bohatchuk D.A.*
author_facet Bohatchuk D.A.*
Kuhnem Jr. P.R.*
Casa, Ricardo Trezzi
Reis E.M.
Bogo, Amauri
Moreira E.N.
author_role author
author2 Kuhnem Jr. P.R.*
Casa, Ricardo Trezzi
Reis E.M.
Bogo, Amauri
Moreira E.N.
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv Bohatchuk D.A.*
Kuhnem Jr. P.R.*
Casa, Ricardo Trezzi
Reis E.M.
Bogo, Amauri
Moreira E.N.
description Wheat leaf diseases cause damage by reducing photosynthetic activity in leaves. The objective was to obtain damage model equations for a wheat multiple pathosystem, by examining the relation between grain yield and the incidence of leaf diseases at different plant growth stages. The experiments were carried in Lages and Sẽo José do Cerrito, SC, during the 2005/06 and 2006/07 crop seasons with cultivars Ônix and BRS Louro. The gradient of disease incidence was obtained by the number of fungicide applications (one, two, and three) and three different fungicide rates: azoxystrobin+cyproconazol (40+16, 60+24 and 80+32 g of a.i. ha-1), trifloxystrobin+tebuconazol (25+50, 50+100 and 75+150 g of a.i. ha-1) and pyraclostrobin+epoxyconazol (33.25+12.5, 66.5+25 e 99.75+37.5 g of a.i. ha-1). Each experiment consisted of ten treatments distributed according to the random block scheme with four repetitions. The leaf disease incidence was evaluated at the growth stages EC 31, 34, 40, 52 and 60 according to Zadok's scale. There was significant correlation between two places and harvests for BRS Louro cultivar in the 40 and 50 plant growth stages. However, this was only significant for the Ônix cultivar in São José do Cerrito in both harvests. The variation between the damage model equations indicates the necessity to continue this research in different places and years, using cultivars with similar leaf disease reactions to those tested in this work. Copyright by the Brazilian Phytopathological Society.
publishDate 2008
dc.date.none.fl_str_mv 2008
2024-12-06T19:23:11Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv 1983-2052
10.1590/S1982-56762008000500004
https://repositorio.udesc.br/handle/UDESC/10071
dc.identifier.dark.fl_str_mv ark:/33523/001300000b9xh
identifier_str_mv 1983-2052
10.1590/S1982-56762008000500004
ark:/33523/001300000b9xh
url https://repositorio.udesc.br/handle/UDESC/10071
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Tropical Plant Pathology
33
5
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv p. 363 - 369
dc.source.none.fl_str_mv reponame:Repositório Institucional da Udesc
instname:Universidade do Estado de Santa Catarina (UDESC)
instacron:UDESC
instname_str Universidade do Estado de Santa Catarina (UDESC)
instacron_str UDESC
institution UDESC
reponame_str Repositório Institucional da Udesc
collection Repositório Institucional da Udesc
repository.name.fl_str_mv Repositório Institucional da Udesc - Universidade do Estado de Santa Catarina (UDESC)
repository.mail.fl_str_mv ri@udesc.br
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