Impact of die carrier on reliability of power LEDs
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) |
Texto Completo: | http://hdl.handle.net/10773/41155 |
Resumo: | High power light emitting diodes (LEDs) suffer from heating effects that have a detrimental impact on the devices characteristics. The use of LED carriers with high thermal conductivity promotes extraction of heat away from the LED junction. Different materials can be used for this purpose, such as alumina, aluminium nitride, and silicon. Diamond has also been gaining momentum for demanding heat management applications. In order to evaluate the impact of the carrier material on the reliability of the devices, the junction temperature of Cree white XLamp XB-D LEDs was obtained with Ansys for various carriers and different LED current levels. The impact of the junction temperature on the LED’s lifetime, emission intensity, footprint, and wavelength stability was then evaluated for each carrier based on the datasheet of the devices. The results provide additional knowledge regarding the impact of the carrier on the performance of the LED. |
id |
RCAP_dbbb7132cad6baebe982b1897da20152 |
---|---|
oai_identifier_str |
oai:ria.ua.pt:10773/41155 |
network_acronym_str |
RCAP |
network_name_str |
Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) |
repository_id_str |
https://opendoar.ac.uk/repository/7160 |
spelling |
Impact of die carrier on reliability of power LEDsLight-emitting diodesReliabilityDiamondPackagingHigh power light emitting diodes (LEDs) suffer from heating effects that have a detrimental impact on the devices characteristics. The use of LED carriers with high thermal conductivity promotes extraction of heat away from the LED junction. Different materials can be used for this purpose, such as alumina, aluminium nitride, and silicon. Diamond has also been gaining momentum for demanding heat management applications. In order to evaluate the impact of the carrier material on the reliability of the devices, the junction temperature of Cree white XLamp XB-D LEDs was obtained with Ansys for various carriers and different LED current levels. The impact of the junction temperature on the LED’s lifetime, emission intensity, footprint, and wavelength stability was then evaluated for each carrier based on the datasheet of the devices. The results provide additional knowledge regarding the impact of the carrier on the performance of the LED.IEEE2024-03-21T18:36:19Z2021-01-01T00:00:00Z2021info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10773/41155eng10.1109/JEDS.2021.3115027Kyatam, ShusmithaAlves, Luis N.Maslovski, StanislavMendes, Joana C.info:eu-repo/semantics/openAccessreponame:Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)instname:FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiainstacron:RCAAP2024-05-06T04:54:41Zoai:ria.ua.pt:10773/41155Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireinfo@rcaap.ptopendoar:https://opendoar.ac.uk/repository/71602025-05-28T14:24:01.646967Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) - FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiafalse |
dc.title.none.fl_str_mv |
Impact of die carrier on reliability of power LEDs |
title |
Impact of die carrier on reliability of power LEDs |
spellingShingle |
Impact of die carrier on reliability of power LEDs Kyatam, Shusmitha Light-emitting diodes Reliability Diamond Packaging |
title_short |
Impact of die carrier on reliability of power LEDs |
title_full |
Impact of die carrier on reliability of power LEDs |
title_fullStr |
Impact of die carrier on reliability of power LEDs |
title_full_unstemmed |
Impact of die carrier on reliability of power LEDs |
title_sort |
Impact of die carrier on reliability of power LEDs |
author |
Kyatam, Shusmitha |
author_facet |
Kyatam, Shusmitha Alves, Luis N. Maslovski, Stanislav Mendes, Joana C. |
author_role |
author |
author2 |
Alves, Luis N. Maslovski, Stanislav Mendes, Joana C. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Kyatam, Shusmitha Alves, Luis N. Maslovski, Stanislav Mendes, Joana C. |
dc.subject.por.fl_str_mv |
Light-emitting diodes Reliability Diamond Packaging |
topic |
Light-emitting diodes Reliability Diamond Packaging |
description |
High power light emitting diodes (LEDs) suffer from heating effects that have a detrimental impact on the devices characteristics. The use of LED carriers with high thermal conductivity promotes extraction of heat away from the LED junction. Different materials can be used for this purpose, such as alumina, aluminium nitride, and silicon. Diamond has also been gaining momentum for demanding heat management applications. In order to evaluate the impact of the carrier material on the reliability of the devices, the junction temperature of Cree white XLamp XB-D LEDs was obtained with Ansys for various carriers and different LED current levels. The impact of the junction temperature on the LED’s lifetime, emission intensity, footprint, and wavelength stability was then evaluated for each carrier based on the datasheet of the devices. The results provide additional knowledge regarding the impact of the carrier on the performance of the LED. |
publishDate |
2021 |
dc.date.none.fl_str_mv |
2021-01-01T00:00:00Z 2021 2024-03-21T18:36:19Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10773/41155 |
url |
http://hdl.handle.net/10773/41155 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1109/JEDS.2021.3115027 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
IEEE |
publisher.none.fl_str_mv |
IEEE |
dc.source.none.fl_str_mv |
reponame:Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) instname:FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologia instacron:RCAAP |
instname_str |
FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologia |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) |
collection |
Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) |
repository.name.fl_str_mv |
Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) - FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologia |
repository.mail.fl_str_mv |
info@rcaap.pt |
_version_ |
1833594561946976256 |