Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction

Bibliographic Details
Main Author: José Martins Ferreira
Publication Date: 2004
Other Authors: Manuel G. Gericota
Format: Book
Language: eng
Source: Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)
Download full: https://repositorio-aberto.up.pt/handle/10216/84067
Summary: Fault-tolerant (FT) architectures based on classic spatial and temporal redundancy are used in anincreasing number of applications. However, the hardware platforms underlying modern highreliabilitysystems have little resemblance to those that were common when such architectureswere devised. The earlier fault models are not necessarily out-of-date (e.g. stuck-at faults stillplay an important role for validating FT applications), but the new failure modes of nanometertechnologies were largely irrelevant when J. von Neumanns paper on the synthesis of reliableorganisms from unreliable components was published in the 1950s. Such concerns areparticularly relevant when designing high-reliability adaptive systems, where reconfigurablefield-programmable gate arrays (FPGAs) are increasingly used. On the other hand, theeconomics of FT architectures based on spatial redundancy (e.g. triple modular redundancy,TMR), are entirely different when evaluated under the assumption of such features as dynamicreconfiguration, which enables just-in-time implementation of only those resources that need tobe available at any given time, or self-reconfiguration, which enables self-contained correctiveactions that are able to isolate / replace defective resources. New design approaches are therefore required to cope with the challenges introduced by each new generation ofprogrammable hardware devices. This paper presents an approach to design high-reliabilityarchitectures at lower cost, by taking advantage of dynamic / self reconfiguration and built-intest infrastructures, which are present in modern generations of FPGAs.
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spelling Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correctionEngenharia electrotécnica, Engenharia electrotécnica, electrónica e informáticaElectrical engineering, Electrical engineering, Electronic engineering, Information engineeringFault-tolerant (FT) architectures based on classic spatial and temporal redundancy are used in anincreasing number of applications. However, the hardware platforms underlying modern highreliabilitysystems have little resemblance to those that were common when such architectureswere devised. The earlier fault models are not necessarily out-of-date (e.g. stuck-at faults stillplay an important role for validating FT applications), but the new failure modes of nanometertechnologies were largely irrelevant when J. von Neumanns paper on the synthesis of reliableorganisms from unreliable components was published in the 1950s. Such concerns areparticularly relevant when designing high-reliability adaptive systems, where reconfigurablefield-programmable gate arrays (FPGAs) are increasingly used. On the other hand, theeconomics of FT architectures based on spatial redundancy (e.g. triple modular redundancy,TMR), are entirely different when evaluated under the assumption of such features as dynamicreconfiguration, which enables just-in-time implementation of only those resources that need tobe available at any given time, or self-reconfiguration, which enables self-contained correctiveactions that are able to isolate / replace defective resources. New design approaches are therefore required to cope with the challenges introduced by each new generation ofprogrammable hardware devices. This paper presents an approach to design high-reliabilityarchitectures at lower cost, by taking advantage of dynamic / self reconfiguration and built-intest infrastructures, which are present in modern generations of FPGAs.2004-102004-10-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookapplication/pdfhttps://repositorio-aberto.up.pt/handle/10216/84067engJosé Martins FerreiraManuel G. Gericotainfo:eu-repo/semantics/openAccessreponame:Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)instname:FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiainstacron:RCAAP2025-02-27T19:44:06Zoai:repositorio-aberto.up.pt:10216/84067Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireinfo@rcaap.ptopendoar:https://opendoar.ac.uk/repository/71602025-05-28T23:29:57.348753Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) - FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiafalse
dc.title.none.fl_str_mv Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
title Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
spellingShingle Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
José Martins Ferreira
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
title_short Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
title_full Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
title_fullStr Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
title_full_unstemmed Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
title_sort Improved dependability for dynamically reconfigurable hardware: restoration of the reliability index via replication and error correction
author José Martins Ferreira
author_facet José Martins Ferreira
Manuel G. Gericota
author_role author
author2 Manuel G. Gericota
author2_role author
dc.contributor.author.fl_str_mv José Martins Ferreira
Manuel G. Gericota
dc.subject.por.fl_str_mv Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
topic Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
description Fault-tolerant (FT) architectures based on classic spatial and temporal redundancy are used in anincreasing number of applications. However, the hardware platforms underlying modern highreliabilitysystems have little resemblance to those that were common when such architectureswere devised. The earlier fault models are not necessarily out-of-date (e.g. stuck-at faults stillplay an important role for validating FT applications), but the new failure modes of nanometertechnologies were largely irrelevant when J. von Neumanns paper on the synthesis of reliableorganisms from unreliable components was published in the 1950s. Such concerns areparticularly relevant when designing high-reliability adaptive systems, where reconfigurablefield-programmable gate arrays (FPGAs) are increasingly used. On the other hand, theeconomics of FT architectures based on spatial redundancy (e.g. triple modular redundancy,TMR), are entirely different when evaluated under the assumption of such features as dynamicreconfiguration, which enables just-in-time implementation of only those resources that need tobe available at any given time, or self-reconfiguration, which enables self-contained correctiveactions that are able to isolate / replace defective resources. New design approaches are therefore required to cope with the challenges introduced by each new generation ofprogrammable hardware devices. This paper presents an approach to design high-reliabilityarchitectures at lower cost, by taking advantage of dynamic / self reconfiguration and built-intest infrastructures, which are present in modern generations of FPGAs.
publishDate 2004
dc.date.none.fl_str_mv 2004-10
2004-10-01T00:00:00Z
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