Advanced technics of automatic inspection based on x-ray and image processing

Bibliographic Details
Main Author: Bruno Daniel Vieira de Pinho
Publication Date: 2018
Format: Master thesis
Language: eng
Source: Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)
Download full: https://hdl.handle.net/10216/113968
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spelling Advanced technics of automatic inspection based on x-ray and image processingEngenharia electrotécnica, electrónica e informáticaElectrical engineering, Electronic engineering, Information engineering2018-07-232018-07-23T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttps://hdl.handle.net/10216/113968TID:202113035engBruno Daniel Vieira de Pinhoinfo:eu-repo/semantics/openAccessreponame:Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)instname:FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiainstacron:RCAAP2025-02-27T20:03:29Zoai:repositorio-aberto.up.pt:10216/113968Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireinfo@rcaap.ptopendoar:https://opendoar.ac.uk/repository/71602025-05-28T23:46:54.328809Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) - FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiafalse
dc.title.none.fl_str_mv Advanced technics of automatic inspection based on x-ray and image processing
title Advanced technics of automatic inspection based on x-ray and image processing
spellingShingle Advanced technics of automatic inspection based on x-ray and image processing
Bruno Daniel Vieira de Pinho
Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electronic engineering, Information engineering
title_short Advanced technics of automatic inspection based on x-ray and image processing
title_full Advanced technics of automatic inspection based on x-ray and image processing
title_fullStr Advanced technics of automatic inspection based on x-ray and image processing
title_full_unstemmed Advanced technics of automatic inspection based on x-ray and image processing
title_sort Advanced technics of automatic inspection based on x-ray and image processing
author Bruno Daniel Vieira de Pinho
author_facet Bruno Daniel Vieira de Pinho
author_role author
dc.contributor.author.fl_str_mv Bruno Daniel Vieira de Pinho
dc.subject.por.fl_str_mv Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electronic engineering, Information engineering
topic Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electronic engineering, Information engineering
publishDate 2018
dc.date.none.fl_str_mv 2018-07-23
2018-07-23T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/masterThesis
format masterThesis
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dc.identifier.uri.fl_str_mv https://hdl.handle.net/10216/113968
TID:202113035
url https://hdl.handle.net/10216/113968
identifier_str_mv TID:202113035
dc.language.iso.fl_str_mv eng
language eng
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