Avaliação dos métodos de modelagem e parametrização de dispositivos fotovoltaicos mono e multi junção

Detalhes bibliográficos
Ano de defesa: 2015
Autor(a) principal: Chenche, Luz Elena Peñaranda
Orientador(a): Não Informado pela instituição
Banca de defesa: Não Informado pela instituição
Tipo de documento: Dissertação
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Universidade Federal de Uberlândia
BR
Programa de Pós-graduação em Engenharia Mecânica
Engenharias
UFU
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Palavras-chave em Português:
Link de acesso: https://repositorio.ufu.br/handle/123456789/14984
https://doi.org/10.14393/ufu.di.2015.172
Resumo: This work deals with the analysis applied to the main methodologies found in literature for estimating the properties related to the physical phenomena in photovoltaic devices (parametrization), as well as the most important mathematical models used in the calculation of operating electrical characteristics of these devices (characterization). These devices are related to the mono and multi-junction technologies, when they are exposed to a condition where the temperature and solar radiation vary. Therefore, four parametrization methods were shown, including three analytical, and five models of electrical characterization, where two of them are specifically for multi-junction devices. Thus, several case studies were proposed which defined different situations for comparing the performance of the methods evaluated. In this way, the procedures that best fit to each type of photovoltaic technology were identified. Finally, according to the results obtained in the parameterization, the method based on the Generalized Reduced Gradient (GRG) nonlinear algorithm showed greater accuracy for all case studies and for all photovoltaic devices. As for the characterization, the main advantages and disadvantages of all models were determined, highlighting Domínguez, et al. (2010) model, due to the highest robustness and wide application range.