Síntese e propriedades estruturais de filmes finos de PbTiO3 obtidos pelo método dos precursores poliméricos.

Detalhes bibliográficos
Ano de defesa: 2023
Autor(a) principal: Mariano, Marcos Aparecido dos Santos
Orientador(a): Não Informado pela instituição
Banca de defesa: Não Informado pela instituição
Tipo de documento: Dissertação
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Universidade Federal de Uberlândia
Brasil
Programa de Pós-graduação em Física
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Palavras-chave em Português:
Link de acesso: https://repositorio.ufu.br/handle/123456789/37571
http://doi.org/10.14393/ufu.di.2023.7032
Resumo: Ferroelectric materials, discovered in 1921 by Joseph Valasek, exhibit spontaneous and reversible polarization upon application of an external electric field. They have been studied extensively since the 1940s, and have many applications, such as pyroelectric sensors, memory devices, electro-optical devices, capacitors, and others. Between them, lead titanate (PbTiO3 - PT) material stands out, which has a perovskite structure with tetragonal symmetry (P4mm space group), a Curie temperature of around ~490 °C (the ferroelectric-paraelectric phases transition temperature), low dielectric permittivity and high spontaneous polarization. These characteristics make the PbTiO3 a promising material for several applications, including infrared detectors and piezoelectric devices. With the advance of the synthesis and characterization techniques, however, new properties have been discovered and studied over the last years, whose real origin still remains unclear up today. In this way, this work aims the synthesis of PT thin films, as well as the study of the structural and microstructural properties. The films were synthesized by the Pechini’s method (or the polymeric precursors method), and their structural and microstructural characterizations were performed by X-ray diffraction (XRD), Raman spectroscopy (RS) and atomic force microscopy (AFM) techniques.