Dinâmica da magnetização e ruído Barkhausen em filmes finos magnéticos amorfos
Ano de defesa: | 2006 |
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Autor(a) principal: | |
Orientador(a): | |
Banca de defesa: | |
Tipo de documento: | Tese |
Tipo de acesso: | Acesso aberto |
Idioma: | por |
Instituição de defesa: |
Universidade Federal de Santa Maria
BR Física UFSM Programa de Pós-Graduação em Física |
Programa de Pós-Graduação: |
Não Informado pela instituição
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Departamento: |
Não Informado pela instituição
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País: |
Não Informado pela instituição
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Palavras-chave em Português: | |
Link de acesso: | http://repositorio.ufsm.br/handle/1/3875 |
Resumo: | In this work, the effect of the thickness on the statistical properties of Barkhausen noise and dynamic hysteresis in thin films with compositions Fe73.5Cu1Nb3Si13.5B9, Fe73.5Cu1Nb3Si16.5B6, Fe73.5Cu1Nb3Si18.5B4 and Co70.4Fe4.6Si15B10 was investigated. Thin films with thickness between 20 nm to 5000 nm were investigated. The samples were produced by magnetron sputtering at the LMMM/UFSM. Barkhausen noise was observed in films as thin as 20nm, a result never reported before in the literature. It was observed that the thickness of the films affects subtly the exponents of size and time duration distributions, in this way that the studied samples can be included in the universality class of amorphous materials whose magnetization dynamics is dominated by short range interactions. This fact is remarkable in principle because a strong perpendicular anisotropy was observed to appear for thickness above 80 nm. With respect to the study of the dynamic hysteresis, it was shown that these materials follow simple scale laws as described by model of domain wall depinning proposed by Bland and co-workers. The exponents obtained from the analysis of the hysteresis loop area, α and β, exhibited a wide range of values, generally higher for thinner films. |