Caracterização de filmes finos de nanopartículas de prata depositados por sputtering sobre resina epóxi

• Ano de defesa: 2012
• Autor(a) principal: Andrade, José Elisandro de
• Orientador(a): Macêdo, Marcelo Andrade
• Tipo de documento: Tese
• Tipo de acesso: Acesso aberto
• Idioma: por
• Programa de Pós-Graduação: Pós-Graduação em Física
• Palavras-chave em Português: Nanopartículas - Prata; Semicondutores; Espectrometria por raios X; Resinas epoxi
• Palavras-chave em Inglês: Epoxy resins; Semiconductors; Spectrometry, X-ray emission
• Área do conhecimento CNPq: CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
• Link de acesso: https://ri.ufs.br/handle/riufs/5375

In this work silver atoms were deposited by ion sputtering on the surface of two types of diglycidyl ether of bisphenol A (DGEBA) epoxy resin. The films of DGEBA and its precursors were characterized by Raman and infrared spectroscopy to identify the main functional groups and their relationship with the deposited silver atoms. Thermogravimetric (TG) and differential themogravimetric (DTG) analysis, and Raman spectroscopy was performed to study the thermal effects in the resin. Silver thin films of 5, 10, 15 and 20 nm were deposited on the epoxy resin at room temperature. Both the initial film of DGEBA and the subsequent silver thin film were analyzed by Atomic Force Microscopy (AFM) in non-contact mode. Silver thin films were also analyzed by x-ray diffraction (XRD) at room temperature. The AFM results showed the formation of silver crystallites on the surface of DGEBA at very low coverage whereas XRD indicated that most of them had their main axis aligned to the normal of the surface. Increase in the coverage led to an increase in the grain size as indicated by AFM. XRD results however indicated that the crystallite size remained almost constant while the appearance of peaks corresponding to other crystalline orientati ons suggests the coalescence of the original crystallites and an increase in size of the more dense planes, namely [111].