Bifurcações dinâmicas em circuitos eletrônicos

Detalhes bibliográficos
Ano de defesa: 2012
Autor(a) principal: Onias, Heloisa Helena dos Santos
Orientador(a): Não Informado pela instituição
Banca de defesa: Não Informado pela instituição
Tipo de documento: Dissertação
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Universidade Federal de Pernambuco
Brasil
UFPE
PROGRAMA DE PÓS-GRADUAÇÃO EM FÍSICA
Departamento de Física
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Palavras-chave em Português:
Link de acesso: https://repositorio.ufrn.br/jspui/handle/123456789/24397
Resumo: The RLD circuit, formed by a resistor, an inductor and a diode in series, displays a very rich dynamics when forced by an external harmonic voltage, and it has being studied for decades. However, there are some topics in nonlinear dynamics that are still studied with variants of this circuit nowadays. Changes in the control parameters may cause electronic oscillations between regular and chaotic regions.The diode is the nonlinear element responsible for the appearance of chaos. Using a nonlinear capacitance model to describe the behavior of the diode, we can write the equations for this system and study its dynamics numerically. Our main objective was the study of critical exponents in complex dynamic bifurcations. For that, we did a numerical study of the RLD circuit forced sinusoidally using as control parameters the amplitude of the input voltage and the frequency. We made, from the time series obtained, bifurcation diagrams with different stroboscopic cuts, which have cascade of period-doubling, periodic windows and intermittent transition. We also did numerical studies of the average behavior in the periodic-chaos transition region searching for characteristic critical exponent and oscilasções on average, elements that have been observed in the logistic map. It was not possible to observe the oscillations numerically, but we observed an exponential decay with critical exponent of approximately 0.5. We set up a system able to control, acquire and process experimental data making it possible to perform remote simultaneous experiments with two different circuits. We have obtained experimental diagrams bifurcations in which we observe that the system has hysteresis and high sensitivity to the conditions of the experiment such as the step of scanning the control parameter.