Estudos de propriedades estruturais e térmicas de bicamadas de OPA

• Ano de defesa: 2002
• Autor(a) principal: Giselle Nogueira Fontes
• Tipo de documento: Dissertação
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Universidade Federal de Minas Gerais; UFMG
• Palavras-chave em Português: Bicamadas de OPA; Microscopia de varredura por sonda; Auto construção(Química); Raio X Difração; Física
• Link de acesso: http://hdl.handle.net/1843/ESCZ-5KUNZX

Thermal and structural properties of thick layers of Octadecylphosphonic Acid (OPA) are studied in this work. Two experimental techniques were used to investigate the structural properties of OPA: AFM Atomic Force Microscopy and X-Ray Reflectivity and Diffraction. Scattering techniques, such as X ray reflectivity and diffraction were needed because the AFM technique only investigates surface properties of a material and does not reveal details of its internal structure. OPA forms thick layers on several substrates, like mica, GaAs and Si. This study reveals that these layers are in fact molecular bilayers. For the study of thermal properties only AFM was used. Samples of OPA bilayers deposited on mica, GaAs and Si were annealed at different temperatures and during different times. This work reveals that when bilayers are annealed they stack, unstack and re-stack, depending on the temperature they are submitted to.