Microscopia de varredura por sonda em materiais carbonosos

Detalhes bibliográficos
Ano de defesa: 2013
Autor(a) principal: Almeida, Rodrigo Queiros de
Orientador(a): Não Informado pela instituição
Banca de defesa: Não Informado pela instituição
Tipo de documento: Dissertação
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Não Informado pela instituição
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Palavras-chave em Português:
Link de acesso: http://www.repositorio.ufc.br/handle/riufc/13698
Resumo: Graphene is dened as one-dimensional crystal structure, formed by a hexagonal network of carbon atoms,and due to the in unique structural and electronic properties, there is a great interest in investigating the physical properties of materials obtained from the chemical modi cation of graphene. Furthermore, graphene is the basic structural framework for all allotropes of carbon structure graphitic (hybridization sp2) and may be curled in a spherical shape, forming fullerenes (0D), rolled up into a cylindrical structure known as carbon nanotubes (1D), stacked, thus generating graphite (3D) and cut into stripes thus forming graphene nanoribbons. Among these materials derived from graphene, those that are synthesized from the oxidation of the graphene sheet, called graphene oxide (GO) are set apart. This work was focused to sample preparation of carbon nanostructures and their caracterization by means of Scanning Probe Microscopies (SPM) aiming to get a better understanding of the morphology and physical properties of these materials. In particular, the goal of this study was to investigate the morphological characteristics of CNTs and the electrostatic properties of graphene using SPM techniques. For this, we analyzed the mechanical behavior of carbon nanotubes when subjected to a radial compression by using AFM tip and the results were compared with those reported in the literature. Regardig the graphene we measured by AFM (Atomic Force Microscopy), EFM (Electric Force Microscopy) and Raman spectroscopy in pristine graphene, graphene treated with nitric oxide and graphene oxide, and the results were discussed and compared to each other. The graphene samples were obtained by using the exfoliation method of graphite and mechanical measurements performed in ambient atmosphere. The results showed that treatment with nitric acid resulted in peak shift of G band in graphene and also caused a change in the electrostatic behavior of edges of the sample when compared to pristine graphene.