Desenvolvimento de filmes finos condutores transparentes de nanofios de prata depositados sobre substratos rígidos

Detalhes bibliográficos
Ano de defesa: 2018
Autor(a) principal: Firmino, Sandro Fernandes lattes
Orientador(a): Feil, Adriano Friedrich lattes
Banca de defesa: Não Informado pela instituição
Tipo de documento: Tese
Tipo de acesso: Acesso aberto
Idioma: por
Instituição de defesa: Pontifícia Universidade Católica do Rio Grande do Sul
Programa de Pós-Graduação: Programa de Pós-Graduação em Engenharia e Tecnologia de Materiais
Departamento: Escola Politécnica
País: Brasil
Palavras-chave em Português:
Palavras-chave em Inglês:
Área do conhecimento CNPq:
Link de acesso: http://tede2.pucrs.br/tede2/handle/tede/8257
Resumo: This work proposes the development of a low cost protocol for the production of TCNTs based on silver nanowires (AgNWs) on rigid substrates, and the improvement of the deposition technique to obtain a higher layer homogeneous, aiming at the optimization of its optical and electrical properties. For this, silver nanowires with length and diameter control were produced, aiming to evaluate the influence of these parameters on the optical and electrical properties of TCTFs. The effects of thermal annealing on the morphology of AgNWs networks and on the electrical and optical properties of TCTFs were also investigated. Studies were carried out to improve the deposition technique to obtain more homogeneous films and, as a result of this study, a new deposition technique (VMCV - Vertical Controlled Mechanical Vibration) was developed with INPI (National Institute of Intellectual Property). Silver nanowires were synthesized through the polyol process, which uses a polymer (N-vinylpyrrolidone) (PVP) as the coating agent. The prepared solutions of AgNWs were deposited on rigid substrates (glass / silicon) for analysis of topological and chemical surfaces, resulting in a random network of nanowires. The networks of AgNWs were characterized by MEV-FEG, UV-Vis, XPS and DSC-TGA techniques. The effect of thermal annealing on the AgNWs networks was investigated by means of in situ measurements of the evolution of the electrical resistances, through the technique of two tips, on a hot plate with temperature control system. Our best results exhibit an optical transparency (~ 83% at 550 nm) equivalent to commercial metal oxide thin films (indium oxide-oxide, ITO or fluoride oxide and tin oxide, FTO) and sheet resistance of ~ 23 Ω / □.