Multilayer Architecture for Fault Diagnosis of Embedded Systems

• Main Author: Maas D.N.
• Publication Date: 2021
• Other Authors: Sebem R.*, Leal, Andre Bittencourt
• Format: Article
• Language: eng
• Source: Repositório Institucional da Udesc
• dARK ID: ark:/33523/0013000005z7g
• Download full: https://repositorio.udesc.br/handle/UDESC/4003

© 2021, Prognostics and Health Management Society. All rights reserved.This work presents a multilayer architecture for fault diagnosis in embedded systems based on formal modeling of Discrete Event Systems (DES). Most works on diagnosis of DES focus in faults of actuators, which are the devices subject to intensive wear in industry. However, embedded systems are commonly subject to cost reduction, which may increase the probability of faults in the electronic hardware. Further, in tech support of a product without a diagnosis system, it takes time to identify if the fault is in software or the electronic board. In this case, the most common solution is to replace the whole electronic board with an updated version of the code. We propose a modeling approach which includes the isolation of the source of the fault in the model, regard-ing three layers of embedded systems: software, hardware and sensors & actuators. The proposed method is applied to a home appliance refrigerator and after exhaustive practical tests with forced fault occurrences, all faults were diagnosed, precisely identifying the layer and the faulty component. The solution was then incorporated into the product manufactured in industrial scale.