A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs
Main Author: | |
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Publication Date: | 2006 |
Other Authors: | , , |
Format: | Book |
Language: | eng |
Source: | Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) |
Download full: | https://hdl.handle.net/10216/84667 |
Summary: | The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing complex customizable circuits. To increase the amount of logic available, manufacturers are using nanometric technologies to boost logic density and reduce prices. However, the use of nanometric scales also makes FPGAs particularly vulnerable to radiation-induced faults, especially because of the increasing amount of configuration memory cells that are necessary to define their functionality. This paper describes a framework for implementing circuits immune to radiation-induced faults, based on a customized Triple Modular Redundancy (TMR) infrastructure and on a detection-and-fix controller. This controller is responsible for the detection of data incoherencies, location of the faulty module and restoration of the original configuration, without affecting the normal operation of the mission logic. A short survey of the most recent data published concerning the impact of radiation-induced faults in FPGAs is presented to support the assumptions underlying our proposed framework. A detailed explanation of the controller functionality is also provided, followed by an experimental case study. |
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A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAsEngenharia electrotécnica, electrónica e informáticaElectrical engineering, Electronic engineering, Information engineeringThe outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing complex customizable circuits. To increase the amount of logic available, manufacturers are using nanometric technologies to boost logic density and reduce prices. However, the use of nanometric scales also makes FPGAs particularly vulnerable to radiation-induced faults, especially because of the increasing amount of configuration memory cells that are necessary to define their functionality. This paper describes a framework for implementing circuits immune to radiation-induced faults, based on a customized Triple Modular Redundancy (TMR) infrastructure and on a detection-and-fix controller. This controller is responsible for the detection of data incoherencies, location of the faulty module and restoration of the original configuration, without affecting the normal operation of the mission logic. A short survey of the most recent data published concerning the impact of radiation-induced faults in FPGAs is presented to support the assumptions underlying our proposed framework. A detailed explanation of the controller functionality is also provided, followed by an experimental case study.20062006-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookapplication/pdfhttps://hdl.handle.net/10216/84667engManuel G. GericotaLuís F. LemosGustavo R. AlvesJosé M. Ferreirainfo:eu-repo/semantics/openAccessreponame:Repositórios Científicos de Acesso Aberto de Portugal (RCAAP)instname:FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiainstacron:RCAAP2025-02-27T19:47:50Zoai:repositorio-aberto.up.pt:10216/84667Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireinfo@rcaap.ptopendoar:https://opendoar.ac.uk/repository/71602025-05-28T23:32:39.853171Repositórios Científicos de Acesso Aberto de Portugal (RCAAP) - FCCN, serviços digitais da FCT – Fundação para a Ciência e a Tecnologiafalse |
dc.title.none.fl_str_mv |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
title |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
spellingShingle |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs Manuel G. Gericota Engenharia electrotécnica, electrónica e informática Electrical engineering, Electronic engineering, Information engineering |
title_short |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
title_full |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
title_fullStr |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
title_full_unstemmed |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
title_sort |
A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs |
author |
Manuel G. Gericota |
author_facet |
Manuel G. Gericota Luís F. Lemos Gustavo R. Alves José M. Ferreira |
author_role |
author |
author2 |
Luís F. Lemos Gustavo R. Alves José M. Ferreira |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Manuel G. Gericota Luís F. Lemos Gustavo R. Alves José M. Ferreira |
dc.subject.por.fl_str_mv |
Engenharia electrotécnica, electrónica e informática Electrical engineering, Electronic engineering, Information engineering |
topic |
Engenharia electrotécnica, electrónica e informática Electrical engineering, Electronic engineering, Information engineering |
description |
The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing complex customizable circuits. To increase the amount of logic available, manufacturers are using nanometric technologies to boost logic density and reduce prices. However, the use of nanometric scales also makes FPGAs particularly vulnerable to radiation-induced faults, especially because of the increasing amount of configuration memory cells that are necessary to define their functionality. This paper describes a framework for implementing circuits immune to radiation-induced faults, based on a customized Triple Modular Redundancy (TMR) infrastructure and on a detection-and-fix controller. This controller is responsible for the detection of data incoherencies, location of the faulty module and restoration of the original configuration, without affecting the normal operation of the mission logic. A short survey of the most recent data published concerning the impact of radiation-induced faults in FPGAs is presented to support the assumptions underlying our proposed framework. A detailed explanation of the controller functionality is also provided, followed by an experimental case study. |
publishDate |
2006 |
dc.date.none.fl_str_mv |
2006 2006-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/book |
format |
book |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://hdl.handle.net/10216/84667 |
url |
https://hdl.handle.net/10216/84667 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
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info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
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application/pdf |
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