Cerqueira, M. F., Ferreira, J. A., & Adriaenssens, G. J. (2000). Structural studies and influence of the structure on the electrical and optical properties of microcrystalline silicon thin films produced by RF sputtering.
Chicago Style CitationCerqueira, M. F., J. A. Ferreira, and G. J. Adriaenssens. Structural Studies and Influence of the Structure On the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced By RF Sputtering. 2000.
MLA CitationCerqueira, M. F., J. A. Ferreira, and G. J. Adriaenssens. Structural Studies and Influence of the Structure On the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced By RF Sputtering. 2000.
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