1
Assuntos:
“...Simulador 3-D TCAD...”
State-of-the-art 3-D Monte Carlo Device Simulation : from n-MOSFETs to n-FinFETs
Tese
2
3
Assuntos:
“...TCAD...”
Reliability evaluation of finFET-based SRAMs in the presence of resistive defects
Tese